Committee Members on Why You Should Attend DVCon 2018
Tom Fitzpatrick, Program Chair
“I am very proud of the program we have put together for our attendees at DVCon this year. It is the must-attend conference for design and verification engineers because it continues to grow and evolve with the needs of industry. This year we’ve added some new vertical topic areas that I think attendees will find particularly intriguing and useful. Safety critical verification is a theme that attendees will see addressed throughout the conference, and the tutorials on Thursday afternoon are focused primarily on issues surrounding automotive safety and compliance. There is also a paper that will discuss UVM-based Verification of a RISC-V Processor Core. There is something for everyone at DVCon and our team of reviewers has done an excellent job of pulling the best for the program from an outstanding group of proposals.”
Vanessa Cooper, Panel Chair
Once again, I am impressed with the quality of the panel submissions that we received this year. I believe the audience will find that the two that were selected are both highly relevant and engaging topics. Both panels will be held on Wednesday, February 28.
The first panel, “Help! System Coverage is a Big Data Problem” will be moderated by Brian Bailey of Semiconductor Engineering. The panelists will explore how Portable Stimulus, formal verification, and emulation can be used to help provide confidence in closing system coverage.
The second panel, “The Right Tool (or Tools) for the Toughest Verification Tasks” will be moderated by Jean-Marie Brunet of Mentor, A Siemens Business. This panel also explores the various tools available to us as verification engineers. The panelists will discuss and debate which tools are better for which tasks as well as why some tools tend to dominate more than others.
Both panels boast an impressive list of panelists, but I highly encourage the audience to jump in with questions to spur a more spirited conversation. We look forward to seeing you at DVCon U.S.!”