Session Chair: Ann Keffer
[1062] Lessons Learned Using Formal for Functional Safety
Doug Smith, Doulos
[1072] A Comprehensive Safety Verification Solution for SEooC Automotive SoC
Gaurav Kumar Yadav, Samsung Semiconductor India R&D; Debasis Mishra, Samsung Semiconductor India R&D; PrashantKumar Shukranath Sonavane, Samsung Semiconductor India R&D; Aniruddha N Anavatti, Samsung Semiconductor India R&D; Pattan Farooq Khan, Samsung Semiconductor India R&D; Garima Srivastava, Samsung Semiconductor India R&D
[1140] A Novel Approach for faster diagnostic coverage closure aided by STL of CPU Cores
Naveen Srivastava, Samsung Semiconductor India R & D; Amresh Kumar Lenka, Samsung Semicoductor India R&D; Varun Kumar C, Samsung Semiconductor India R & D; Subramanian R, Samsung Semiconductor India R & D; Sekhar Dangudubiyyam, Samsung Semiconductor India R & D
[1055] Automated Formal Verification of Area-Optimized Safety Registers in Automotive SoCs
Shuhang Zhang, Infineon Technologies AG; Bryan Olmos, Infineon Technologies AG