Session 2: Functional Safety

Session Chair: Ann Keffer

• [1062] Lessons Learned Using Formal  for Functional Safety 
  • Doug Smith, Doulos
• [1072] A Comprehensive Safety Verification Solution for SEooC Automotive SoC 
  • Gaurav Kumar Yadav, Samsung Semiconductor India R&D; Debasis Mishra, Samsung Semiconductor India R&D; PrashantKumar Shukranath Sonavane, Samsung Semiconductor India R&D; Aniruddha N Anavatti, Samsung Semiconductor India R&D; Pattan Farooq Khan, Samsung Semiconductor India R&D; Garima Srivastava, Samsung Semiconductor India R&D       
• [1140] A Novel Approach for faster diagnostic coverage closure aided by STL of CPU Cores 
  • Naveen Srivastava, Samsung Semiconductor India R & D; Amresh Kumar Lenka, Samsung Semicoductor India R&D; Varun Kumar C, Samsung Semiconductor India R & D; Subramanian R, Samsung Semiconductor India R & D; Sekhar Dangudubiyyam, Samsung Semiconductor India R & D        
• [1055] Automated Formal Verification of Area-Optimized Safety Registers in Automotive SoCs 
  • Shuhang Zhang, Infineon Technologies AG; Bryan Olmos, Infineon Technologies AG