Session Chair: Harish Patel
[1065] A Scalable Gray-Box Instance-Based Reachability Predictor for Automated DV Regression Scheduling
Lorenzo Ferretti, Micron Technology; Chinmaya Behera, Micron Technology; Surya Teja Bandlamudi, Micron Technology; Nihar Athreyas, Micron Technology; Vikram Narayan, Micron Technology; Samir Mittal, Micron Technology
[1045] A Large Language Model-Based Framework for Enhancing Integrated Regression
Jin Choi, Samsung Electronics; Noh Sangwoo, Samsung Electronics
[1058] Automating Regression Triage in Design Verification Using AI-Based Random Forest Models
Lingkai Shi, AMD; Rohit Mathur, Amd
[1132] A Novel AI-ML Regression Flow for SoC verification
Sunil Shrirangrao Kashide, samsung semiconductor India(SSIR); Narasimha Rao Chinni, samsung semiconductor India(SSIR); Garima Srivastava, samsung semiconductor India(SSIR)