Session Chair: Harish Patel

  • [1065] A Scalable Gray-Box Instance-Based Reachability Predictor for Automated DV Regression Scheduling 
    • Lorenzo Ferretti, Micron Technology; Chinmaya Behera, Micron Technology; Surya Teja Bandlamudi, Micron Technology; Nihar Athreyas, Micron Technology; Vikram Narayan, Micron Technology; Samir Mittal, Micron Technology       
  • [1045] A Large Language Model-Based Framework for Enhancing Integrated Regression 
    • Jin Choi, Samsung Electronics; Noh Sangwoo, Samsung Electronics           
  • [1058] Automating Regression Triage in Design Verification Using AI-Based Random Forest Models 
    • Lingkai Shi, AMD; Rohit Mathur, Amd           
  • [1132] A Novel AI-ML Regression Flow for SoC verification 
    • Sunil Shrirangrao Kashide, samsung semiconductor India(SSIR); Narasimha Rao Chinni, samsung semiconductor India(SSIR); Garima Srivastava, samsung semiconductor India(SSIR)