Technical Session 5 [Functional Safety and Verification]

1022: Leveraging Several Functional Safety Methodologies (Full Faults And Srf) To Enhance Design Quality In Automotive Ic
Sougata Bhattacharjee, Samsung Semiconductor India Research (SSIR); Gulshan Kumar Sharma, Samsung Semiconductor India Research (SSIR); Wonil Cho, Samsung Electronics; Akshaya Kumar Jain, Samsung Semiconductor India Research (SSIR); James Kim, Siemens; Andrey Likhopoy, Samsung Electronics; Sangkyu Park, Samsung Electronics; Hyeonuk Noh, Samsung Electronics; Ann Keffer, Siemens; Arun Gogineni, Siemens
1040: Functional Safety Workflow Of Internal Ip (Npu) Within Large Automotive Ic Through Analysis And Emulation Usage For Sw-Based Safety Mechanisms
Andrey Likhopoy, Samsung Electronics; Sangkyu Park, Samsung Electronics; Hyeonuk Noh, Samsung Electronics; Wonil Cho, Samsung Electronics; Inhwan Kim, Siemens EDA; Robert Serphillips, Siemens EDA; Chanjin Kim, Siemens EDA; Justin Lee, Siemens EDA; James Kim, Siemens EDA; Sougata Bhattacharjee, Samsung Semiconductor India Research (SSIR); Gulshan Kumar Sharma, Samsung Semiconductor India Research (SSIR); Akshaya Kumar Jain, Samsung Semiconductor India Research (SSIR)
1052: Ai Based Media Functional Safety And Reliability Verification In Safety-Critical Autonomous Systems
Suresh Vasu, Intel Corporation; palanivel guruvareddiar, Intel Corporation; pooja sundar, Intel Corporation
1068: Are My Fault Campaigns Provideing Accurate Results For Iso 26262 Certification?
James(JAE YUN) Kim, Siemens EDA; Arun Gogineni, Siemens EDA; Ann keffer, Siemens EDA; Ahn Hyunsun, Samsung LSI