1022: Leveraging Several Functional Safety Methodologies (Full Faults And Srf) To Enhance Design Quality In Automotive Ic
Sougata Bhattacharjee, Samsung Semiconductor India Research (SSIR); Gulshan Kumar Sharma, Samsung Semiconductor India Research (SSIR); Wonil Cho, Samsung Electronics; Akshaya Kumar Jain, Samsung Semiconductor India Research (SSIR); James Kim, Siemens; Andrey Likhopoy, Samsung Electronics; Sangkyu Park, Samsung Electronics; Hyeonuk Noh, Samsung Electronics; Ann Keffer, Siemens; Arun Gogineni, Siemens