Andrey Likhopoy, Samsung Electronics; Sangkyu Park, Samsung Electronics; Hyeonuk Noh, Samsung Electronics; Wonil Cho, Samsung Electronics; Inhwan Kim, Siemens EDA; Robert Serphillips, Siemens EDA; Chanjin Kim, Siemens EDA; Justin Lee, Siemens EDA; James Kim, Siemens EDA; Sougata Bhattacharjee, Samsung Semiconductor India Research (SSIR); Gulshan Kumar Sharma, Samsung Semiconductor India Research (SSIR); Akshaya Kumar Jain, Samsung Semiconductor India Research (SSIR)
Achieving the desired safety level is burdened by the runtime of fault injection and also data management over the duration of the fault campaign. In this paper we describe the process of data management and fault injection runtime optimizations that reduce the time to achieve the desired safety level and the product certification. The paper gives a case study of the fault campaign flow for an internal IP (NPU) in a large automotive IC by using the emulation for S/W-based safety mechanisms.
