This session highlights breakthrough AI-powered advancements in debug workflows for RTL design and verification, featuring state-of-the-art capabilities of the Synopsys Verdi platform. Attendees will learn how Verdi's intelligent technology leverages sophisticated artificial intelligence (AI) to enhance collaborative problem-solving, streamline data analysis, and facilitate multi-level debug across simulation, emulation, formal, and static verification environments. Integration with Synopsys verification tools and popular development environments enables users to interact with Verdi for a range of investigative and diagnostic tasks.

Through practical examples and a live demonstration, the session will showcase how next-generation AI can accelerate root cause analysis, suggest effective solutions, and enable comprehensive, data-driven debug strategies. Key features—including advanced interactivity, context-aware analysis, and innovative workflow integration—will be explored. Participants will see how Verdi platform's cutting-edge AI capabilities are transforming the debug process for modern silicon development.